SHIMADZU MAIVIS MIV-X Ultrasonic Optical Flaw Detector is a new non destructive inspection device that
uses ultrasonic waves and light to detect defects hidden on the surface or near surface of the sample to
be inspected.
Ultrasonic waves are propagated to the surface of the object to be inspected, and minute displacements of
the surface generated by vibration are observed by differential interference measurement (shearography)
using laser light and a camera.
By monitoring (visualizing) the propagation status of ultrasonic waves, it is possible to detect defective
area such as cracks and cavities near the surface, peeling in joint or adhering of dissimilar material,
peeling of coating (painting, thermal spraying, etc.).
• Visualize and digitize hidden defects such as voids and cracks near the surface of
sample and peeling of joint area of multi-material.
It is possible to inspect the surface and near the surface, which is difficult with conventional
ultrasonic flaw detection. Even dissimilar materials can be inspected without worrying about the
difference in acoustic impedance.
• The propagation status of ultrasonic waves is displayed as a moving image to acquire
clearer image.
Equipped with Noise Removal function to make it easy to identify defects.
• Inspect a wide area at once in a short time.
Inspection time is 25 seconds or less for area of up to 400 x 600 mm.
• Equipped with dimensional measurement and marking functions.
Easily recognize the size and location of the defect part.
• Line up of optical zoom sets (optional) can detect even smaller defects.
The minimum defect detection size of 0.5mm is possible.
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